Integrated circuit comprising fractional clock multiplication circuitry

ABSTRACT

Circuitry capable of performing fractional clock multiplication by using an injection-locked oscillator is described. Some embodiments described herein perform fractional clock multiplication by periodically changing the injection location, from a set of injection locations, where the injection signal is injected and/or by periodically changing a phase, from a set of phases, of the injection signal that is injected into the ILO.

RELATED APPLICATION

This application is a continuation of, and claims priority to, U.S.application Ser. No. 13/686,175, having the same title and inventors asthe instant application, filed 27 Nov. 2012, which is hereinincorporated by reference in its entirety for all purposes. U.S.application Ser. No. 13/686,175 is a non-provisional of, and claimspriority to, U.S. Provisional Application No. 61/563,973, having thesame title and inventors as the instant application, filed 28 Nov. 2011,which is herein incorporated by reference in its entirety for allpurposes.

BACKGROUND

This disclosure generally relates to electronic circuits. An integratedcircuit (IC) may include one or more clock domains, each having a clocksignal. In some applications, the frequency of the clock signal may needto be changed.

BRIEF DESCRIPTION OF THE FIGURES

FIG. 1A illustrates circuitry capable of performing fractional clockmultiplication by using an injection-locked oscillator (ILO) inaccordance with some embodiments described herein.

FIG. 1B illustrates a four-stage ILO in accordance with some embodimentsdescribed herein.

FIG. 1C illustrates a delay element of an ILO in accordance with someembodiments described herein.

FIG. 1D illustrates a delay element of an ILO in accordance with someembodiments described herein.

FIG. 2A illustrates circuitry capable of performing fractional clockmultiplication by using an ILO in accordance with some embodimentsdescribed herein.

FIG. 2B illustrates some waveforms associated with the circuitry shownin FIG. 2A in accordance with some embodiments described herein.

FIG. 3A illustrates circuitry capable of performing fractional clockmultiplication by using an ILO in accordance with some embodimentsdescribed herein.

FIG. 3B illustrates some waveforms associated with the circuitry shownin FIG. 3A in accordance with some embodiments described herein.

FIG. 4A illustrates circuitry capable of performing fractional clockmultiplication by using an ILO in accordance with some embodimentsdescribed herein.

FIG. 4B illustrates some waveforms associated with the circuitry shownin FIG. 4A in accordance with some embodiments described herein.

FIG. 4C illustrates circuitry capable of performing fractional clockmultiplication by using an ILO in accordance with some embodimentsdescribed herein.

FIG. 4D illustrates circuitry for generating gating signals inaccordance with some embodiments described herein.

FIG. 5A illustrates circuitry capable of performing fractional clockmultiplication by using an ILO in accordance with some embodimentsdescribed herein.

FIG. 5B illustrates some waveforms associated with the circuitry shownin FIG. 5A in accordance with some embodiments described herein.

FIG. 6 illustrates how control information can be distributed inaccordance with some embodiments described herein.

FIG. 7 illustrates an IC in accordance with some embodiments describedherein.

FIG. 8 presents a flowchart that illustrates a process for performingfractional clock multiplication using an ILO in accordance with someembodiments described herein.

DETAILED DESCRIPTION

Some embodiments presented in this disclosure feature circuitry capableof performing fractional clock multiplication by using an ILO.Specifically, some embodiments described herein perform fractional clockmultiplication by periodically changing the injection location of theILO where the injection signal is injected and/or by periodicallychanging a phase of the injection signal.

Some embodiments of the fractional clock multiplication circuitrydescribed herein are capable of switching the clock frequency fasterthan other approaches for performing fractional clock multiplication,e.g., approaches based on a phase-locked loop (PLL) or a delay-lockedloop (DLL). Specifically, some embodiments described herein are capableof switching the clock frequency in less than or equal to 10 ns.According to one definition, a fractional clock multiplier switches to atarget frequency when the fractional clock multiplier begins outputtinga clock signal whose frequency is substantially constant and whosefrequency is substantially equal to the target frequency, and optionallywhose phase is substantially equal to a desired clock phase.

FIG. 1A illustrates circuitry capable of performing fractional clockmultiplication by using an ILO in accordance with some embodimentsdescribed herein.

In some embodiments described herein, fractional clock multiplicationcircuitry 102 can receive one or more input signal(s) 106, and generateoutput signal 108. The ratio between the frequency of input signal(s)106 and output signal 108 can be an integer or a fraction (e.g., 0.4,0.8, 1.0, 1.4, 2.5, 3.0, etc.).

In some embodiments described herein, input signal(s) 106 contains asingle master clock signal. In other embodiments described herein, inputsignal(s) 106 contains multiple copies of a master clock signal whichhave the same frequency, but which have different phases.

In some embodiments described herein, fractional clock multiplicationcircuitry 102 can include ILO 114, and injection signal generationcircuitry 104. ILO 114 may have multiple delay elements R1-Rn that arearranged in a loop. The output from one of the delay elements can beprovided as output signal 108. A delay element in the loop may or maynot invert its input signal. However, the loop inverts the signal. Thefact that the delay loop inverts the signal is illustrated in thefigures of this disclosure by using a rectangular box with a “−1”written inside the box. The rectangular box may not correspond to anactual circuit element, and the value written inside the rectangular boxmay not correspond to the actual gain of the loop. In some embodiments,the rectangular box with a “−1” written inside the box may representthat the loop has an odd number of single-ended delay elements thatinvert the signal. In some embodiments, the rectangular box with a “−1”written inside the box may represent that the differential outputs of anodd number of differential delay elements are provided, with reversepolarity, to the next differential delay element in the loop.

Injection signal generation circuitry 104 can generate one or moreinjection signal(s) 110 based on input signal(s) 106. Injectionsignal(s) 110 can be injected into one or more injection locations(e.g., delay elements) in ILO 114. In some embodiments described herein,injection signal generation circuitry 104 can perform fractional clockmultiplication by periodically changing the injection location where theinjection signal is injected and/or by periodically changing a phase ofthe injection signal.

Injection signal generation circuitry 104 can optionally receive controlsignal 112 which can be used to modify the fractional clockmultiplication ratio between the frequency of output signal 108 and thefrequency of input signal(s) 106.

ILO 114 may optionally receive ILO control signal 116 which may be usedto modify the delay of the delay elements R1-Rn, thereby modifying thenatural oscillation frequency of ILO 114. In some embodiments describedherein, ILO control signal 116 may be used to ensure that the naturaloscillation frequency of ILO 114 remains substantially constant evenwhen the operating conditions (e.g., temperature and/or voltage) change.

The delay elements in some of the figures of this disclosure have beenshown as single-ended delay elements for the sake of clarity. However,it will be apparent to those skilled in the art that the single-endeddelay elements may be replaced with differential delay elements.

FIG. 1B illustrates a four-stage ILO in accordance with some embodimentsdescribed herein. The four-stage ILO shown in FIG. 1B can correspond toan embodiment of ILO 114 shown in FIG. 1A.

ILO 130 can include delay elements 136-142 arranged in a loop. As shownin FIG. 1B, each delay element may receive differential signals from theprevious delay element in the loop and output differential signals thatare provided as inputs to the next delay element in the loop. In someembodiments, an odd number of stages of the ILO may invert the signal.For example, as shown in FIG. 1B, the differential outputs of delayelement 142 are provided to the opposite polarity inputs of delayelement 136 (e.g., the “+” and “−” outputs of delay element 142 can becoupled with the “−” and “+” inputs of delay element 136, respectively).Output signals 134 from the delay elements can be used to generate theoutput signal of ILO 130. In some embodiments, the output of one of thedelay elements can be provided as an output of ILO 130. In someembodiments, the outputs from multiple delay elements can be provided asinputs to a multiplexer or blender, and the output of the multiplexer orblender can be provided as the output of ILO 130.

FIG. 1C illustrates a delay element of an ILO in accordance with someembodiments described herein.

As shown in FIG. 1C, a delay element can include differential transistorpair M1 and M2 which can receive the differential input signal S_(IN)and S _(IN) as input. RL1 and RL2 can be load resistances, and V_(DD)can be the supply voltage. The drains of transistors M1 and M2 can becoupled with a switch that is controlled by the injection signal, whichis illustrated as “Pulse” in FIG. 1C. In the embodiment shown in FIG.1C, the injection signal is not a differential signal.

FIG. 1D illustrates a delay element of an ILO in accordance with someembodiments described herein. The delay element illustrated in FIG. 1Dcan correspond to a delay element shown in FIG. 1B, e.g., delay element136.

The circuitry shown in FIG. 1D can receive differential input signalsand produce differential output signals. As shown in FIG. 1D,differential pulse signals can be provided to the switches.

Various modifications to the disclosed embodiments will be readilyapparent to those skilled in the art, and the general principles definedherein may be applied to other embodiments and applications withoutdeparting from the spirit and scope of the present disclosure. Somevariations and modifications of the embodiments illustrated in FIG.1A-1D are described below.

FIG. 2A illustrates circuitry capable of performing fractional clockmultiplication by using an ILO in accordance with some embodimentsdescribed herein. FIG. 2A can correspond to an embodiment of fractionalclock multiplication circuitry 102 shown in FIG. 1A.

ILO 214 includes four delay elements 202-208 that are arranged in aloop. The output of delay element 208 is provided as output signal 216.Injection signal generation circuitry 210 can receive input signal 212(e.g., a master clock signal). The outputs from injection signalgeneration circuitry 210 can be injected into delay elements 202-208.Injection signal generation circuitry 210 can also receive controlsignal 218 that can be used to control the fractional clockmultiplication ratio, i.e., the ratio between the frequency of inputsignal 212 and the frequency of output signal 216.

The embodiment illustrated in FIG. 2A can perform fractional clockmultiplication by periodically changing the injection location where theinjection signal is injected. In general, injection signal generationcircuitry 210 can inject the injection signal into different injectionlocations in any given order. For example, in successive clock cycles ofinput signal 212, injection signal generation circuitry 210 can injectthe injection signal into delay elements 202, 204, 206, 208, and thenwrap around to delay element 202. In another example, injection signalgeneration circuitry 210 can alternate between delay elements 202 and206. In yet another example, injection signal generation circuitry 210can inject the injection signal in reverse order, e.g., injection signalgeneration circuitry 210 may inject the injection signal into delayelements 208, 206, 204, etc. in successive clock cycles.

FIG. 2B illustrates some waveforms associated with the circuitry shownin FIG. 2A in accordance with some embodiments described herein.

Waveforms 252, 254, 256, and 258 can correspond to the inputs of delayelements 202, 204, 206, and 208, respectively. Waveform 252 can alsocorrespond to an inverted version of output signal 216 since an invertedversion of the output of delay element 208 is provided as an input todelay element 202. Waveform 260 can correspond to input signal 212, andwaveform 262 can correspond to the injection signal that is generatedfrom input signal 212.

Fractional clock multiplication can be achieved by periodically changingthe injection location. In one example, the injection location can bechanged as follows: at time T0, inject the injection signal (shown bywaveform 262) into delay element 202; at time T1, inject the injectionsignal into delay element 204; at time T2, inject the injection signalinto delay element 206; at time T3, inject the injection signal intodelay element 208; at time T4, wrap around and inject the injectionsignal into delay element 202; and so forth.

When the injection signal is injected in this manner, the edges inwaveforms 252-258 line up with the injection pulses in waveform 262 asfollows: at time T0, the injection signal pulse in waveform 262 isaligned with a corresponding positive edge in waveform 252; at time T1,the injection signal pulse in waveform 262 is aligned with acorresponding positive edge of waveform 254; at time T2, the injectionsignal pulse in waveform 262 is aligned with a corresponding positiveedge of waveform 256; and, at time T3, the injection signal pulse inwaveform 262 is aligned with a corresponding positive edge of waveform258. The edges in waveforms 252-258 that line up with the injectionsignal pulses are highlighted using dashed ovals. This alignment patternrepeats for T4-T7, except that the alignment is with negative edgesinstead of positive edges. (At time instances T4-T7, an inverted versionof the injection signal may be injected into the delay elements so thatthe negative edges of waveforms 252-258 line up with the invertedinjection signal.)

The ratio between the frequency of input signal 212 (which correspondsto waveform 260) and the frequency of output signal 216 (whichcorresponds to an inverted version of waveform 252) is a fraction. Insome embodiments, the fractional clock multiplication ratio is given by

$\frac{f_{2}}{f_{1}} = \frac{{2 \cdot N} + n}{2 \cdot N}$where ƒ₁ is the frequency of the input signal, ƒ₂ is the frequency ofthe output signal, N is the total number of delay elements in the ILO,and n is the number of delay elements by which the injection location ismoved forward (i.e., from left to right in FIG. 2A) in each clock cycle.If the injection location is moved backward, then n is negative.

FIG. 3A illustrates circuitry capable of performing fractional clockmultiplication by using an ILO in accordance with some embodimentsdescribed herein. FIG. 3A can correspond to an embodiment of fractionalclock multiplication circuitry 102 shown in FIG. 1A.

ILO 314 includes four delay elements 302-308 that are arranged in aloop. The output of delay element 308 is provided as output signal 316.Injection signal generation circuitry 310 can receive input signals 312which may include four copies of a master clock signal with differentphases (shown as (Φ0-Φ3). The output from injection signal generationcircuitry 310 can be injected into one of the delay elements, e.g.,delay element 302. Injection signal generation circuitry 310 can alsoreceive control signal 318 that can be used to control the fractionalclock multiplication ratio, i.e., the ratio between the frequency ofinput signals 312 and the frequency of output signal 316.

The embodiment illustrated in FIG. 3A can perform fractional clockmultiplication by periodically changing the phase of the injectionsignal. For example, in successive clock cycles of input signal 312,injection signal generation circuitry 310 can inject an injection signalinto delay element 302 that corresponds to phases Φ0, Φ1, Φ2, Φ3, andthen wraps around to phase Φ0. In another example, injection signalgeneration circuitry 310 can alternate between phases Φ0 and Φ2. In yetanother example, injection signal generation circuitry 310 can changethe phase in reverse order, e.g., injection signal generation circuitry310 can inject an injection signal into delay element 302 with phasesΦ3, Φ2, Φ1, etc. in successive clock cycles.

FIG. 3B illustrates some waveforms associated with the circuitry shownin FIG. 3A in accordance with some embodiments described herein.

Waveform 350 can correspond to the input signal with phase Φ0. Waveforms352, 354, 356, and 358 can correspond to the injection signals that aregenerated based on input signals 312 with phases Φ0, Φ1, Φ2, and Φ3,respectively. Waveform 360 can correspond to the injection signal thatis injected into delay element 302. Waveform 362 can correspond tooutput signal 316.

Fractional clock multiplication can be achieved by periodically changingthe phase of the injection signal. For example, the phase of theinjection signal can be changed as follows: between time T0-T1, injectthe injection signal based on Φ0 into delay element 302; between timeT1-T2, inject the injection signal based on Φ1 into delay element 302;between time T2-T3, inject the injection signal based on Φ2 into delayelement 302; between time T3-T4, inject the injection signal based on Φ3into delay element 302; between time T4-T5, do not inject an injectionsignal; between time T5-T6, wrap around and inject the injection signalbased on Φ0 into delay element 302; and so forth. The pulses that areinjected into delay element 302 are highlighted in FIG. 3B using dashedovals.

Waveform 360 shows the result of periodically changing the phase of theinjection signal. Specifically, waveform 360 shows the timing of thepulses in the injection signal that is injected into delay element 302.The positive edges of waveform 362 (which corresponds to output signal316) line up with the pulses in waveform 360. In this manner, afractional clock multiplication ratio can be achieved between thefrequency of input signals 312 and the frequency of output signal 316.

In some embodiments, the fractional clock multiplication ratio is givenby

${\frac{f_{2}}{f_{1}} = \frac{T}{T + t}},$where ƒ₁ is the frequency of the input signal, ƒ₂ is the frequency ofthe output signal, T is a clock period of the input signal (e.g., thetime difference between time T0 and T1 in FIG. 3B), and t is the phasedelay (e.g., the time difference between time T1 and the positive edgeof the second pulse in waveform 354) that is added in each clock cycle.If a negative phase delay is introduced in each clock cycle, then t willbe a negative value.

FIG. 4A illustrates circuitry capable of performing fractional clockmultiplication by using an ILO in accordance with some embodimentsdescribed herein. Specifically, FIG. 4A provides further details ofinjection signal generation circuitry 210 shown in FIG. 2A.

Injections signal generation circuitry 210 can include gating signalgeneration circuitry 438, pulse generator 434, and gates 416-422. Inputsignal 212 can be provided as input to pulse generator 434 and gatingsignal generation circuitry 438. The output from pulse generator 434 canbe provided as one of the inputs to gates 416-422. The outputs from thegating signal generation circuitry 438 can be provided as the otherinput to gates 416-422. The outputs from gates 416-422 can be injectedinto corresponding delay elements 202-208.

In some embodiments described herein, the injection signal from pulsegenerator 434 is injected into a delay element depending on the value ofthe corresponding gating signal. In these embodiments, the gating signalgeneration circuitry 438 can use its output signals to periodicallychange the location where the injection signal is injected into ILO 214.For example, to inject the injection signal into gate 202, gating signalgeneration circuitry 438 can provide a “1” signal to gate 416, andprovide a “0” signal to gates 418-422.

Control signal 218 can be used to control the fractional clockmultiplication ratio that is desired between input signal 212 and outputsignal 216. For example, gating signal generation circuitry 438 can usecontrol signal 218 to determine how to move the injection location(e.g., forward or backward, and by how much).

FIG. 4B illustrates some waveforms associated with the circuitry shownin FIG. 4A in accordance with some embodiments described herein.

Waveform 452 can correspond to the output of pulse generator 434, andwaveforms 454-460 can correspond to the gating signal that is providedto gates 416-422. Due to the timing relationship between the output ofpulse generator 434 and the gating signals, the injection signal isinjected as follows: the pulse at time T0 is injected into delay element202 via gate 416; the pulse at time T1 is injected into delay element204 via gate 418; the pulse at time T2 is injected into delay element206 via gate 420; the pulse at time T3 is injected into delay element208 via gate 422; the pulse at time T4 is injected into delay element202 via gate 416; and so forth.

FIG. 4C illustrates circuitry capable of performing fractional clockmultiplication by using an ILO in accordance with some embodimentsdescribed herein. Specifically, FIG. 4C provides further details ofinjection signal generation circuitry 210 shown in FIG. 2A.

Shift registers 424-430 can be arranged in a loop. Input signal 212 canbe provided as input to pulse generator 434 and also to 2× clockmultiplier 432. The output of 2× clock multiplier 432 can be provided asthe clock signal to shift registers 424-430. The outputs of shiftregisters 424-430 can be provided as inputs to crossbar 436. The outputsfrom crossbar 436 can be provided as the gating signals to gates416-422. Control signal 218 can be provided as a configuration input tocrossbar 436. Crossbar 436 can be configured so that the injectionlocation moves by a desired amount in a desired direction in each clockcycle.

In some embodiments, the gating signals shown in waveforms 454-460 inFIG. 4B can be generated as follows: (1) initialize shift registers424-430 so that one of the shift registers, e.g., shift register 430contains a “1” value, and the remaining shift registers contain a “0”value (note that when a clock signal is provided to the shift registers,the shift registers circulate the “1” value), and (2) configure crossbar436 so that each input is passed through to the corresponding output.

FIG. 4D illustrates circuitry for generating gating signals inaccordance with some embodiments described herein. Specifically, FIG. 4Dprovides further details of gating signal generation circuitry 438 shownin FIG. 4A.

In some embodiments described herein, the gating signals can begenerated using a DLL. Gating signal generation circuitry 438 caninclude a divide by N circuit 440 (where N is the number of delayelements in the ILO for which gating signals are desired to begenerated), a phase/frequency detector 442, charge pump and low-passfilter 444, and a voltage controlled oscillator (VCO) with multi-phaseoutputs 446.

The output signals of VCO with multi-phase outputs 446 can be used togenerate gating signals for gates 416-422 shown in FIG. 4A. In someembodiments described herein, the duty cycles of the output signals ofVCO with multi-phase outputs 446 can be adjusted to produce the gatingsignal waveforms 454-460 shown in FIG. 4B. In some embodiments describedherein, two VCO outputs with different phases may be XORed together togenerate a gating signal. In some embodiments described herein, thegating signals can be routed through a crossbar (similar to theconfiguration shown in FIG. 4C) before being provided to the gates. Thecrossbar can be configured so that the injection location moves by adesired amount in a desired direction in each clock cycle.

FIG. 5A illustrates circuitry capable of performing fractional clockmultiplication by using an ILO in accordance with some embodimentsdescribed herein. Specifically, FIG. 5A provides further details ofinjection signal generation circuitry 310 shown in FIG. 3A.

Injection signal generation circuitry 310 can include pulse generators524-530, multiplexer control circuitry 520, and multiplexer 532. Pulsegenerators 524-530 can receive input signals with phases Φ0-Φ3. Theoutputs from pulse generators 524-530 can be provided as inputs tomultiplexer 532, and the output from multiplexer 532 can be provided asan injection signal to delay element 302.

Multiplexer control circuitry 520 can receive one of the input signals,e.g., the input signal with phase Φ0, and control signal 318, which canbe used to control the fractional clock multiplication ratio. The outputfrom multiplexer control circuitry 520 can be provided as a selectsignal to multiplexer 532. Multiplexer control circuitry 520 canperiodically change the phase of the injection signal that is injectedinto delay element 302 by periodically changing the input signal (fromthe four input signals that are provided to multiplexer 532, as shown inFIG. 5A) that is selected by multiplexer 532.

FIG. 5B illustrates some waveforms associated with the circuitry shownin FIG. 5A in accordance with some embodiments described herein.

Waveforms 556-562 can correspond to the outputs from pulse generators524-530. Waveform 554 can correspond to the select signal that isprovided to multiplexer 532. The numbers inside waveform 554 indicatethe multiplexer input that is selected by multiplexer 532. For example,the number “0” between time T0 and T1 indicates that input “0” of themultiplexer (which receives the input signal with phase Φ0) is coupledto the output during this time period. The dash symbol shown betweentime T4 and T5 indicates that none of the inputs of multiplexer 532 isselected during this time period (when none of the inputs is selected, a“0” value may be outputted by multiplexer 532).

Waveform 564 can correspond to the output of multiplexer 532. The outputof multiplexer 532 can be provided as an injection signal to delayelement 302, so that ILO 314 generates output signal 316 (whichcorresponds to waveform 362 shown in FIG. 3B).

FIG. 6 illustrates how control information can be distributed inaccordance with some embodiments described herein.

Master clock generator 602 can include DLL 604 that uses ring oscillator616. The loop delay of ring oscillator 616 may change when operatingconditions (e.g., voltage and/or temperature) change. DLL 604 canmaintain a substantially constant frequency multiplication ratio betweenmaster clock signal 606 and reference clock signal 618 by continuallyadjusting the loop delay of ring oscillator 616 as the operatingconditions change. The delay adjustment information (shown as controlinformation 608 in FIG. 6) can be distributed by master clock generator602 to other ILOs that are being used in fractional clock multiplicationcircuitries. For example, as shown in FIG. 6, master clock signal 606and control information 608 (which includes the delay adjustmentinformation) can be distributed to ILO-based fractional clockmultipliers 610-614. The ILO-based fractional clock multipliers 610-614can use control information 608 to adjust the loop delays of their ILOs,thereby ensuring that the natural oscillation frequency of the ILOsremains substantially constant even when operating conditions change.

FIG. 7 illustrates an IC in accordance with some embodiments describedherein.

IC 702 may include multiple clock domains. Each clock domain can beoperated using an independent clock signal. According to one definition,two clock signals are independent of each other if their frequencies canbe modified independently of each other. According to one definition, aclock domain refers to a portion of an integrated circuit that operatesbased on a given clock signal.

In some embodiments described herein, IC 702 may include a master clockdomain, e.g., master clock domain 704, and one or more other clockdomains, e.g., clock domains 706-710. Master clock domain 704 mayoperate under master clock signal 718. Fractional clock multiplicationcircuitries 712-716 may be used to generate clock signals based onmaster clock signal 718 by using fractional clock multiplication. Theclock signals generated by fractional clock multiplication circuitries712-716 can then be provided to clock domains 706-710. Fractional clockmultiplication circuitries 712-716 may receive separate control signalsthat may be used to independently change the frequencies of the clocksignals in clock domains 706-710.

In some embodiments described herein, IC 702 may correspond to aprocessor, and clock domains 704-710 may correspond to differentprocessing units within the processor. For example, master clock domainmay include front-end processing circuitry, clock domain 706 may includecircuitry for an arithmetic logic unit, clock domain 708 may includecircuitry for a floating point unit, and clock domain 710 may includecircuitry for a memory load/store unit. The processor may be capable ofusing the fractional clock multiplication circuitry corresponding toeach clock domain to independently change the operating frequency of theclock domain.

FIG. 8 presents a flowchart that illustrates a process for performingfractional clock multiplication using an ILO in accordance with someembodiments described herein.

In some embodiments described herein, one or more injection signals maybe generated (operation 802). Next, one of the following may beperiodically changed: (1) a location, from a set of injection locationsof the ILO, where an injection signal is injected, or (2) a phase, froma set of phases, of the injection signal that is injected into the ILO(operation 804).

The methods and/or processes that have been implicitly or explicitlydescribed in this disclosure can be embodied in hardware, software, or acombination thereof. Hardware embodiments include, but are not limitedto, IC chips, field-programmable gate arrays (FPGAs), and otherprogrammable-logic devices now known or later developed.

Various modifications to the disclosed embodiments will be readilyapparent to those skilled in the art, and the general principles definedherein may be applied to other embodiments and applications withoutdeparting from the spirit and scope of the present disclosure. Thus, thescope of the present disclosure is not limited to the embodiments shown,but is to be accorded the widest scope consistent with the principlesand features disclosed herein.

What is claimed is:
 1. An integrated circuit, comprising: aninjection-locked oscillator (ILO) comprising a plurality of delayelements arranged in a loop; circuitry to periodically select adifferent injection location in the ILO, wherein each injection locationcorresponds to a delay element in the plurality of delay elements; andcircuitry to inject an injection signal into the selected injectionlocation in the ILO.
 2. The integrated circuit of claim 1, wherein thecircuitry to periodically select a different injection locationcomprises: a plurality of gates, wherein an output of each gate iscoupled to an injection input of a corresponding delay element in theplurality of delay elements; and circuitry to generate a plurality ofgating signals, wherein each gating signal is provided as an input to acorresponding gate in the plurality of gates.
 3. The integrated circuitof claim 2, wherein the circuitry to inject the injection signal intothe selected delay element provides the injection signal as an input toeach gate in the plurality of gates.
 4. The integrated circuit of claim2, wherein the circuitry to generate the plurality of gating signalscomprises a plurality of shift registers arranged in a loop.
 5. Theintegrated circuit of claim 4, wherein the circuitry to generate theplurality of gating signals comprises a crossbar, wherein the outputs ofthe plurality of shift registers are provided as inputs to the crossbar,and wherein the outputs of the crossbar are provided as the plurality ofgating signals.
 6. The integrated circuit of claim 2, wherein thecircuitry to generate the plurality of gating signals comprises adelay-locked loop having a plurality of output signals with differentphases.
 7. The integrated circuit of claim 6, wherein the circuitry togenerate the plurality of gating signals comprises a crossbar, whereinthe plurality of output signals of the delay-locked loop are provided asinputs to the crossbar, and wherein the outputs of the crossbar areprovided as the plurality of gating signals.
 8. An integrated circuit,comprising: an injection-locked oscillator (ILO) comprising a pluralityof delay elements arranged in a loop; circuitry to generate a pluralityof injection signals having different phases; circuitry to periodicallyselect a different injection signal in the plurality of injectionsignals; and circuitry to inject the selected injection signal into adelay element of the ILO.
 9. The integrated circuit of claim 8, whereinthe circuitry to periodically select a different injection signalcomprises: a multiplexer to select an injection signal from theplurality of injection signals based on a select signal; and circuitryto periodically change the select signal.
 10. The integrated circuit ofclaim 8, comprising circuitry to periodically select a differentinjection location in the ILO, wherein each injection locationcorresponds to a delay element in the plurality of delay elements, andwherein the selected injection signal is injected into the selectedinjection location.
 11. The integrated circuit of claim 10, wherein thecircuitry to periodically select a different injection locationcomprises: a plurality of gates, wherein an output of each gate iscoupled to an injection input of a corresponding delay element in theplurality of delay elements; and circuitry to generate a plurality ofgating signals, wherein each gating signal is provided as an input to acorresponding gate in the plurality of gates.
 12. The integrated circuitof claim 11, wherein the circuitry to inject the selected injectionsignal provides the selected injection signal as an input to each gatein the plurality of gates.
 13. The integrated circuit of claim 11,wherein the circuitry to generate the plurality of gating signalscomprises a crossbar and a plurality of shift registers arranged in aloop, wherein the outputs of the plurality of shift registers areprovided as inputs to the crossbar, and wherein the outputs of thecrossbar are provided as the plurality of gating signals.
 14. Theintegrated circuit of claim 11, wherein the circuitry to generate theplurality of gating signals comprises a crossbar and a delay-locked loophaving a plurality of output signals with different phases, wherein theplurality of output signals of the delay-locked loop are provided asinputs to the crossbar, and wherein the outputs of the crossbar areprovided as the plurality of gating signals.
 15. An integrated circuit,comprising: circuitry to generate an injection signal based on a firstclock signal; a fractional clock multiplier to generate a second clocksignal based on the first clock signal, the fractional clock multipliercomprising: an injection-locked oscillator (ILO) comprising a pluralityof delay elements arranged in a loop; circuitry to periodically select adifferent injection location in the ILO, wherein each injection locationcorresponds to a delay element in the plurality of delay elements; andcircuitry to inject the injection signal into the selected injectionlocation in the ILO; and circuitry that operates based on the secondclock signal.
 16. The integrated circuit of claim 15, wherein thecircuitry to periodically select a different injection locationcomprises: a plurality of gates, wherein an output of each gate iscoupled to an injection input of a corresponding delay element; andcircuitry to generate a plurality of gating signals, wherein each gatingsignal is provided as an input to a corresponding gate in the pluralityof gates.
 17. The integrated circuit of claim 12, wherein the circuitryto inject the injection signal into the selected delay element providesthe injection signal as an input to a gate that corresponds to theselected delay element.
 18. The integrated circuit of claim 12, whereinthe circuitry to generate the plurality of gating signals comprises acrossbar and a plurality of shift registers arranged in a loop, whereinthe outputs of the plurality of shift registers are provided as inputsto the crossbar, and wherein the outputs of the crossbar are provided asthe plurality of gating signals.
 19. The integrated circuit of claim 12,wherein the circuitry to generate the plurality of gating signalscomprises a crossbar and a delay-locked loop having a plurality ofoutput signals with different phases, wherein the plurality of outputsignals of the delay-locked loop are provided as inputs to the crossbar,and wherein the outputs of the crossbar are provided as the plurality ofgating signals.
 20. The integrated circuit of claim 15, wherein theintegrated circuit is a processor, and wherein the circuitry thatoperates based on the second clock signal is one of: an arithmetic logicunit, a floating point unit, or a memory load/store unit.